| Mini Clinic Jan. 12 2011 6:00- 6:20pm | | | Root Cause Analysis using Orthogonal Defect Classification.
Presenter: Chaitanya Baliga
Synopsis: Orthogonal Defect classification (ODC) has been used in understanding the dynamics of software development by using Classification of Defects. The ODC based root cause analysis provides an ability to analyze the defect as a by-product ofprocess execution. An attempt is made in this presentation to introduce this model into classical root cause analysis by selectively analyzing data/process streams. This model has a potential that can be exploited in execution of a root cause analysis / quality improvement process with speed and simplicity.
Chaitanya Baliga is Senior ASQ Member and Special Projects Chair in ASQ Section 402. He holds three ASQ certifications: CQA, CQM/OE and CSSGB. Currently, he is with Baxter Corporation as Quality Assessment Manager. | | |
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